Improving the Sensitivity of Electron Beam Microanalytical Techniques by Enhanced X-ray Spectrometry: X-ray Microcalorimetry, Silicon Drift Detector Energy Dispersive X-ray Spectrometry, and Polycapillary X-ray Optics
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چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: e-Journal of Surface Science and Nanotechnology
سال: 2003
ISSN: 1348-0391
DOI: 10.1380/ejssnt.2003.130